Proximity 3d-Scanning profiler

The Profilometrov NV (Nanosystem, Korea) series is intended for the uncontacted 3d measurement of the surface in the way of the white light scanning interferometry.

• Precision 0.1 nm in vertical direction, 0.2 micro in horizontal direction
• Scan Range 270 μm
• Easy and easy-to-do interface
• Speed of measurement
• The proximity dimension eliminates damage to the sample surface
• High reproducible measurement results
• Display an image in 2d and 3d format
• Ability to "stitch" multiple images

Features NV-1800

• Compact model
• Low cost
• Manual table Adjustment (50 mm)
• Move Z (top-down) 30 mm-Manual
• Single Lens