NV-3200

Proximity 3d-Scanning profiler

The Profilometrov NV (Nanosystem, Korea) series is intended for the uncontacted 3d measurement of the surface in the way of the white light scanning interferometry.

  • Precision 0.1 nm in vertical direction, 0.2 micro in horizontal direction
  • Scan Range 270 μm
  • Easy and easy-to-do interface
  • Speed of measurement
  • The proximity dimension eliminates damage to the sample surface
  • High reproducible measurement results
  • Display an image in 2d and 3d format
  • Ability to "stitch" multiple images

Features NV-3200

  • Auto
  • Motorized table (300 x 300 mm)
  • Move along the z axis (top-down) 100 mm-Motorized
  • 5 Lenses
  • Motorized Tourelles
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